TEM-MICROSTRUCTURAL INVESTIGATIONS OF ION-BEAM MODIFIED CERAMICS WITH RESPECT TO THEIR MACROSCOPIC PROPERTIES

被引：5

作者：

FISCHER, W ^{[1
]}

WOLF, GK ^{[1
]}

RUOFF, H ^{[1
]}

KATERBAU, KH ^{[1
]}

机构：

[1] UNIV STUTTGART,STAATLICHE MAT PRUFUNGSANSTALT,W-7000 STUTTGART 80,GERMANY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 80-1卷

关键词：

D O I：

10.1016/0168-583X(93)90743-P

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The high costs for production, surface finishing, sensitivity against fracture, and unsatisfactory friction behaviour are the main problems for broader applications of engineering ceramics. Ion beam techniques are universal methods for basic research with respect to doping, surface treatment and coating, and a potential method for generating materials with specific surface properties. Transmission electron microscopy (TEM) is a suitable technique for understanding the results of four-point bending tests and dynamic hardness measurements of Ar or Ti implanted polycrystalline Si3N4. It was possible to characterize the transformations of the Si3N4 grains and the surrounding binder phases caused by ion implantation and to obtain information on the stability of the modified material.

引用

页码：1091 / 1096

页数：6

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