LABORATORY GRAZING-EMISSION X-RAY-FLUORESCENCE SPECTROMETER

被引：55

作者：

DEBOKX, PK

URBACH, HP

机构：

[1] Philips Research Laboratories, 5656 AA Eindhoven

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 01期

关键词：

D O I：

10.1063/1.1145250

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have developed a laboratory grazing-emission x-ray fluorescence (GEXRF) spectrometer. The instrument utilizes in vacuo wavelength-dispersive detection. Due to the high resolution of a crystal monochromator at long wavelengths, the range of applicability of grazing x-ray techniques is substantially extended to the longer wavelengths as compared to techniques used presently. It is demonstrated that interference fringes in the take-off angle dependence of the fluorescent x-ray intensity of a layered sample can be resolved using a conventional x-ray tube. © 1995 American Institute of Physics.

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页码：15 / 19

页数：5

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