OPTICAL APPLICATION OF A NEW METHOD FOR DETERMINING PROFILES AND SURFACE STATE IN ELECTRON MICROSCOPY

被引：6

作者：

BOUSQUET, P

CAPELLA, L

FORNIER, A

GONELLA, J

机构：

来源：

关键词：

D O I：

10.1364/AO.8.001229

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1229 / +

页数：1

共 9 条

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DELEUIL, R
GASTAUD, A
[J]. JOURNAL DE PHYSIQUE, 1964, 25 (1-2): : 31 - 36
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[5] CHAUVINEAU JP, 1967, REV OPT THEOR INSTRU, V46, P417
[6] REALIZATION AND USE OF A DEVICE FOR STUDY OF IRREGULAR DIOPTERS AND LATTICES IN MILLIMETER WAVES
DELEUIL, R
[J]. OPTICA ACTA, 1969, 16 (01): : 23 - +
[7] GONELLA J, 1968, CR ACAD SCI B PHYS, V266, P1611
[8] GONELLA J, 1967, CR ACAD SCI B PHYS, V265, P148
[9] STROKE GW, 1967, HANDB PHYSIK, V29, P426