CALIBRATION AND USE OF AN ELECTRON MICROSCOPE FOR PRECISION MICROMEASUREMENTS IN THIN FILM MATERIALS

被引：15

作者：

MURR, LE

机构：

来源：

PHYSICA STATUS SOLIDI | 1967年 / 19卷 / 01期

关键词：

D O I：

10.1002/pssb.19670190102

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：7 / &

共 22 条

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