ATOMIC FORCE MICROSCOPY - GENERAL-ASPECTS AND APPLICATION TO INSULATORS

被引：39

作者：

HEINZELMANN, H

MEYER, E

GRUTTER, P

HIDBER, HR

ROSENTHALER, L

GUNTHERODT, HJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575424

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：275 / 278

页数：4

共 13 条

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602

[2] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[3] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

GERBER, C ;

STOLL, E ;

ALBRECHT, TR ;

QUATE, CF .

EUROPHYSICS LETTERS, 1987, 3 (12) :1281-1286

[4] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY [J].

DURIG, U ;

GIMZEWSKI, JK ;

POHL, DW .

PHYSICAL REVIEW LETTERS, 1986, 57 (19) :2403-2406

[5]

GRUTTER P, 1988, J VAC SCI TECHNOL A, V6, P279, DOI 10.1116/1.575425

[6] DESIGN OF AN ATOMIC FORCE MICROSCOPE AND 1ST RESULTS [J].

HEINZELMANN, H ;

GRUTTER, P ;

MEYER, E ;

HIDBER, H ;

ROSENTHALER, L ;

RINGGER, M ;

GUNTHERODT, HJ .

SURFACE SCIENCE, 1987, 189 :29-35

[7] THE PHYSICAL INTERACTION POTENTIAL OF GAS ATOMS WITH SINGLE-CRYSTAL SURFACES, DETERMINED FROM GAS-SURFACE DIFFRACTION EXPERIMENTS [J].

HOINKES, H .

REVIEWS OF MODERN PHYSICS, 1980, 52 (04) :933-970

[8]

MARTI O, IN PRESS

[9] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J].

MARTIN, Y ;

WICKRAMASINGHE, HK .

APPLIED PHYSICS LETTERS, 1987, 50 (20) :1455-1457

[10] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J].

MARTIN, Y ;

WILLIAMS, CC ;

WICKRAMASINGHE, HK .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) :4723-4729

← 1 2 →