SURFACE INVESTIGATIONS USING THE POSITRON REEMISSION MICROSCOPE

被引：42

作者：

VANHOUSE, J

RICH, A

机构：

来源：

PHYSICAL REVIEW LETTERS | 1988年 / 61卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.61.488

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：488 / 491

页数：4

共 19 条

[1] SCANNING POSITRON MICROBEAM [J].

BRANDES, GR ;

CANTER, KF ;

HORSKY, TN ;

LIPPEL, PH ;

MILLS, AP .

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[2]

BRANDES GR, 1987, B AM PHYS SOC, V32, P439

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CHEN, DM ;

BERKO, S ;

CANTER, KF ;

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ROELLIG, LO ;

SFERLAZZO, P ;

WEINERT, M ;

WEST, RN .

PHYSICAL REVIEW LETTERS, 1987, 58 (09) :921-924

[4] POSITRON-BEAM-BRIGHTNESS ENHANCEMENT - LOW-ENERGY POSITRON DIFFRACTION AND OTHER APPLICATIONS [J].

FRIEZE, WE ;

GIDLEY, DW ;

LYNN, KG .

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[5] REEMITTED-POSITRON SPECTROSCOPY OF THIN METAL-FILMS [J].

GIDLEY, DW ;

FRIEZE, WE .

PHYSICAL REVIEW LETTERS, 1988, 60 (12) :1193-1196

[6]

GRIFFEN OH, 1986, ADV OPTICAL ELECTRON, V10

[7] POSITRON DYNAMICS IN RARE-GAS SOLIDS [J].

GULLIKSON, EM ;

MILLS, AP .

PHYSICAL REVIEW LETTERS, 1986, 57 (03) :376-379

[8] ABSENCE OF ENERGY-LOSS IN POSITRON EMISSION FROM METAL-SURFACES [J].

GULLIKSON, EM ;

MILLS, AP ;

CRANE, WS ;

BROWN, BL .

PHYSICAL REVIEW B, 1985, 32 (08) :5484-5486

[9]

Hulett L. D. Jr., 1984, Materials Science Forum, V2, P133, DOI 10.4028/www.scientific.net/MSF.2.133

[10] INVESTIGATION OF SURFACE-DEFECTS ON NI(110) WITH A LOW-ENERGY POSITRON BEAM [J].

KOYMEN, AR ;

GIDLEY, DW ;

CAPEHART, TW .

PHYSICAL REVIEW B, 1987, 35 (03) :1034-1038

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