CO-DEPOSITED THIN-FILMS OF YBA2CU3O7-DELTA-AG

被引：16

作者：

MOSHFEGH, AZ ^{[1
]}

WANG, YQ ^{[1
]}

SUN, YY ^{[1
]}

MESARWI, A ^{[1
]}

HOR, PH ^{[1
]}

IGNATIEV, A ^{[1
]}

机构：

[1] UNIV HOUSTON,TEXAS CTR SUPERCONDUCT,HOUSTON,TX 77204

来源：

PHYSICA C | 1993年 / 218卷 / 3-4期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1016/0921-4534(93)90042-O

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The fabrication of high-temperature superconducting YBa2Cu3O7-delta-Ag (YBCO-Ag) thin films has been investigated using a high-pressure Ag coevaporation-DC sputtering technique. Various analytical techniques including X-ray diffraction (XRD), Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron probe microanalysis (EPMA), energy dispersive X-ray analysis (EDX), and T(c) measurement have been utilized for characterization of the films. Highly reproducible c-oriented (00l) films have been prepared in-situ at a relatively low growth temperature (congruent-to 670-degrees-C) by this technique. The transition temperatures T(c) gradually decreased with added Ag from 90 K (0 at.% Ag) to 72 K (22.3 at.% Ag) for the films deposited on MgO (100) substrates. X-ray diffraction indicated that the Ag is in the metallic state as a separate phase with respect to the YBCO and that the c-lattice parameter of the grown films remained unchanged with Ag addition. Surface morphology of the YBCO-Ag films exhibited a particulate-type structure with the grain size increasing as the Ag content increased. The temperature coefficient of the normalized resistance, dR(T)/R(280 K)/dT, was also noticed to decrease for the Ag-containing samples as compared to Ag-free YBCO films. AES depth profiling identified Ag residing mainly at the YBCO/MgO interface. The effect of Ag addition to the films has been described by a particle growth model.

引用

页码：396 / 406

页数：11

共 43 条

[1] STRUCTURE AND INTERNAL-STRESS IN ULTRATHIN SILVER FILMS DEPOSITED ON MGF2 AND SIO SUBSTRATES [J].