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A METHOD OF EXAMINING SELECTED AREAS OF SURFACES USING REPLICAS AND THE ELECTRON MICROSCOPE

被引：12
作者：
BOOKER, GR
机构：
来源：
BRITISH JOURNAL OF APPLIED PHYSICS | 1954年 / 5卷 / OCT期
关键词：
D O I：
10.1088/0508-3443/5/10/302
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：349 / 350
页数：2
相关论文
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[1]   REPLICA TECHNIQUES IN ELECTRON MICROSCOPY [J].
AGAR, AW ;
REVELL, RSM .
BRITISH JOURNAL OF APPLIED PHYSICS, 1951, 2 (JAN) :8-11
[2]  
AGAR AW, 1952, SEP EL MICR C BRIST
[3]   A METHOD FOR THE ELECTRON AND OPTICAL MICROSCOPIC EXAMINATION OF IDENTICAL AREAS [J].
HYAM, ED ;
NUTTING, J .
BRITISH JOURNAL OF APPLIED PHYSICS, 1952, 3 (JUN) :173-176
[4]   A METHOD OF OBSERVING SELECTED AREAS IN ELECTRON AND OPTICAL MICROSCOPES [J].
NANKIVELL, JF .
BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (MAY) :141-143
[5]  
PAGE RS, 1954, J SC INSTRUM, V31, P27
[6]  
RADAVICH JF, COMMUNICATION
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