KINETIC ELLIPSOMETRY APPLIED TO SOFT-X-RAY MULTILAYER GROWTH-CONTROL

被引:19
作者
HOUDY, P
机构
来源
REVUE DE PHYSIQUE APPLIQUEE | 1988年 / 23卷 / 10期
关键词
D O I
10.1051/rphysap:0198800230100165300
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1653 / 1659
页数:7
相关论文
共 14 条
[1]  
ASPNES D, 1983, J PHYS C SOLID STATE, V44, P610
[2]  
Azzam RMA, 1977, ELLIPSOMETRY POLARIZ
[3]  
Barbee TW, 1985, P SPIE, V563, P2, DOI [10.1117/12.949647, DOI 10.1117/12.949647]
[4]  
BODART V, 1987, MAR P SFV INT S TREN, V1, P15
[5]  
BODART V, 1987, THESIS U PARIS 7
[6]  
DHEZ P, 1985, ERA719 PROJ RAPP
[7]  
DREVILLON, 1982, REV SCI INSTRUM, V53
[8]  
ERMAN M, 1986, THESIS U PARIS 6
[9]  
FALCO, 1985, SPIE, V563, P195
[10]   SPUTTERING TECHNIQUES APPLIED TO REALIZATION OF ULTRATHIN LAYERED STACKS (OF THE ORDER OF NANOMETERS) - INSITU ELLIPSOMETRY CONTROL-SYSTEM [J].
HOUDY, P ;
ZIEGLER, E ;
NEVOT, L .
THIN SOLID FILMS, 1986, 141 (01) :99-109