POLYIMIDE THIN-FILM WAVE-GUIDES - OPTICAL AND RAMAN-SPECTROSCOPIC STUDIES

被引：13

作者：

SAVATINOVA, I ^{[1
]}

TONCHEV, S ^{[1
]}

TODOROV, R ^{[1
]}

VENKOVA, E ^{[1
]}

LIAROKAPIS, E ^{[1
]}

ANASTASSAKIS, E ^{[1
]}

机构：

[1] NATL TECH UNIV ATHENS,DEPT PHYS,LAB 3,GR-15773 ATHENS,GREECE

来源：

JOURNAL OF APPLIED PHYSICS | 1990年 / 67卷 / 04期

关键词：

D O I：

10.1063/1.345589

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Polyimide films deposited on fused quartz, silicon, and ceramic substrates are examined. Waveguide techniques are used to determine the guide modes from which the index of refraction is inferred. Film thicknesses are determined from transmission interferences and, independently, from a luminescence-induced reflection interference pattern. Using a waveguide configuration we also observed and analyzed Raman scattering features in the region above 1000 cm -1.

引用

页码：2051 / 2055

页数：5

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