THEORY OF ELECTRON BAND TAILS AND THE URBACH OPTICAL-ABSORPTION EDGE

被引：263

作者：

JOHN, S

SOUKOULIS, C

COHEN, MH

ECONOMOU, EN

机构：

[1] UNIV PENN, DEPT PHYS, PHILADELPHIA, PA 19104 USA

[2] IOWA STATE UNIV SCI & TECHNOL, US DOE, AMES LAB, AMES, IA 50011 USA

[3] IOWA STATE UNIV SCI & TECHNOL, DEPT PHYS, AMES, IA 50011 USA

[4] EXXON RES & ENGN CO, ANNANDALE, NJ 08801 USA

来源：

PHYSICAL REVIEW LETTERS | 1986年 / 57卷 / 14期

关键词：

D O I：

10.1103/PhysRevLett.57.1777

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1777 / 1780

页数：4

共 20 条

[11] THOMAS-FERMI APPROACH TO IMPURE SEMICONDUCTOR BAND STRUCTURE
KANE, EO
[J]. PHYSICAL REVIEW, 1963, 131 (01): : 79 - &
[12] UBER DIE EXCITONENBANDEN DER ALKALIHALOGENIDKRISTALLE
MARTIENSSEN, W
[J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1957, 2 (04) : 257 - 267
[13] EXPERIMENTAL TEST OF THEORETICAL-MODELS FOR URBACHS RULE AT EXCITONIC ABSORPTION EDGES
MOHLER, E
THOMAS, B
[J]. PHYSICAL REVIEW LETTERS, 1980, 44 (08) : 543 - 546
[14] EXACTLY EXPONENTIAL BAND TAIL IN A GLASSY SEMICONDUCTOR
MONROE, D
KASTNER, MA
[J]. PHYSICAL REVIEW B, 1986, 33 (12) : 8881 - 8884
[15] NUMERICAL EXPERIMENTS ON THE ABSORPTION LINESHAPE OF THE EXCITON UNDER LATTICE-VIBRATIONS .3. THE URBACH RULE
SCHREIBER, M
TOYOZAWA, Y
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1982, 51 (05) : 1544 - 1550
[16] EXPONENTIAL BAND TAILS IN RANDOM-SYSTEMS
SOUKOULIS, CM
COHEN, MH
ECONOMOU, EN
[J]. PHYSICAL REVIEW LETTERS, 1984, 53 (06) : 616 - 619
[17] BAND TAILS IN DISORDERED-SYSTEMS
SRITRAKOOL, W
SAYAKANIT, V
GLYDE, HR
[J]. PHYSICAL REVIEW B, 1986, 33 (02) : 1199 - 1202
[18] URBACH-MARTIENSSEN RULE AND EXCITON TRAPPED MOMENTARILY BY LATTICE VIBRATIONS
SUMI, H
TOYOZAWA, Y
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1971, 31 (02) : 342 - &
[19] THE LONG-WAVELENGTH EDGE OF PHOTOGRAPHIC SENSITIVITY AND OF THE ELECTRONIC ABSORPTION OF SOLIDS
URBACH, F
[J]. PHYSICAL REVIEW, 1953, 92 (05): : 1324 - 1324
[20] THE ABSORPTION EDGES OF GES AND URBACHS RULE
WILEY, JD
THOMAS, D
SCHONHERR, E
BREITSCHWERDT, A
[J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1980, 41 (07) : 801 - 807

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