RETARDING-FIELD-CYLINDRICAL-MIRROR ANALYZER

被引：14

作者：

GERLACH, RL ^{[1
]}

机构：

[1] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1973年 / 10卷 / 01期

关键词：

D O I：

10.1116/1.1317920

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：122 / 125

页数：4

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[1] ANALYSIS OF ENERGY DISTRIBUTION IN CYLINDRICAL ELECTRON SPECTROMETERS
AKSELA, S
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (06) : 810 - &
[2] IONIZATION SPECTROSCOPY OF CONTAMINATED METAL SURFACES
GERLACH, RL
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[3] DIFFERENTIAL CROSS SECTIONS FOR K-SHELL IONIZATION OF SURFACE ATOMS BY ELECTRON IMPACT
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DUCHARME, AR
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[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (01) : 33 - &
[5] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS
HARRIS, LA
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &
[6] HIGH SENSITIVITY AUGER ELECTRON SPECTROMETER
PALMBERG, PW
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[J]. APPLIED PHYSICS LETTERS, 1969, 15 (08) : 254 - &
[7] PHYSICAL LIMITATIONS IN ELECTRON BALLISTICS
PIERCE, JR
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1945, 24 (3-4): : 305 - 321
[8] CYLINDRICAL CAPACITOR AS AN ANALYZER .I. NONRELATIVISTIC PART
SAREL, HZ
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (09) : 1210 - &
[9] RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS
TAYLOR, NJ
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) : 792 - &