ELECTROCHEMICAL PHOTOCAPACITANCE SPECTROSCOPY - A NEW METHOD FOR CHARACTERIZATION OF DEEP LEVELS IN SEMICONDUCTORS

被引：18

作者：

HAAK, R

OGDEN, C

TENCH, D

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1982年 / 129卷 / 04期

关键词：

D O I：

10.1149/1.2123996

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：891 / 893

页数：3

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