CHARACTERIZATION OF INXGA1-XAS/GAAS STRAINED LAYER SUPERLATTICES BY ION BACKSCATTERING-CHANNELING AND X-RAY-DIFFRACTION

被引:6
作者
FLAGMEYER, R
LENKEIT, K
BAUMBACH, T
KANTER, YO
FEDOROV, AA
机构
[1] HUMBOLDT UNIV,SEKT PHYS,DDR-1040 BERLIN,GER DEM REP
[2] ACAD SCI USSR,INST SEMICOND PHYS,NOVOSIBIRSK,USSR
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1988年 / 107卷 / 01期
关键词
D O I
10.1002/pssa.2211070151
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:K19 / K24
页数:6
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