ELECTRON-HOLE RECOMBINATION IN IRRADIATED SIO2 FROM A MICRODOSIMETRY VIEWPOINT

[1] ENERGY-LOSSES AND MEAN FREE PATHS OF ELECTRONS IN SILICON DIOXIDE [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) : 4132 - 4136

[2] ELECTRON-HOLE PAIR CREATION ENERGY IN SIO2 [J]. APPLIED PHYSICS LETTERS, 1975, 26 (04) : 173 - 175

[3] BOAG JW, 1906, RAD DOSIMETRY, V2, P11

[4] BROWN DB, 1969, J APPL PHYS, V40, P1628

[5] HOLE AND ELECTRON-TRANSPORT IN SIO2-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (10) : 4506 - 4513

[6] DOZIER C, 1981, IEEE T NUCL SCI, V28, P4142

[7] DOSE AND DOSE-RATE DEPENDENCE OF 8080A MICROPROCESSOR FAILURES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (04) : 1299 - 1304

[8] PHOTON ENERGY-DEPENDENCE OF RADIATION EFFECTS IN MOS STRUCTURES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) : 1694 - 1699

[9] DOZIER CM, UNPUBLISHED

[10] Hamm R. N., 1978, Sixth Symposium on Microdosimetry, P179

[1] ENERGY-LOSSES AND MEAN FREE PATHS OF ELECTRONS IN SILICON DIOXIDE [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) : 4132 - 4136

[2] ELECTRON-HOLE PAIR CREATION ENERGY IN SIO2 [J]. APPLIED PHYSICS LETTERS, 1975, 26 (04) : 173 - 175

[3] BOAG JW, 1906, RAD DOSIMETRY, V2, P11

[4] BROWN DB, 1969, J APPL PHYS, V40, P1628

[5] HOLE AND ELECTRON-TRANSPORT IN SIO2-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (10) : 4506 - 4513

[6] DOZIER C, 1981, IEEE T NUCL SCI, V28, P4142

[7] DOSE AND DOSE-RATE DEPENDENCE OF 8080A MICROPROCESSOR FAILURES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (04) : 1299 - 1304

[8] PHOTON ENERGY-DEPENDENCE OF RADIATION EFFECTS IN MOS STRUCTURES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) : 1694 - 1699

[9] DOZIER CM, UNPUBLISHED

[10] Hamm R. N., 1978, Sixth Symposium on Microdosimetry, P179