HOLE AND ELECTRON-TRANSPORT IN SIO2-FILMS

被引：99

作者：

CURTIS, OL ^{[1
]}

SROUR, JR ^{[1
]}

CHIU, KY ^{[1
]}

机构：

[1] NORTHROP RES & TECHNOL CTR,HAWTHORNE,CA 90250

来源：

JOURNAL OF APPLIED PHYSICS | 1974年 / 45卷 / 10期

关键词：

D O I：

10.1063/1.1663079

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4506 / 4513

页数：8

共 22 条

[1] PHOTOINJECTION INTO SIO2 - ELECTRON SCATTERING IN IMAGE FORCE POTENTIAL WELL [J].

BERGLUND, CN ;

POWELL, RJ .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (02) :573-+

[2] ELECTRON SCATTERING IN THICK TARGETS [J].

BISHOP, HE .

BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (06) :703-&

[3] CARRIER GENERATION AND TRANSPORT IN ANTHRACENE UNDER ELECTRON BOMBARDMENT [J].

DELANY, JL ;

HIRSCH, J .

JOURNAL OF CHEMICAL PHYSICS, 1968, 48 (10) :4717-&

[4] DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J].

EVERHART, TE ;

HOFF, PH .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) :5837-&

[5]

FRITZSCHE CR, 1971, RADIAT EFF, V7, P87

[6] PHOTOEMISSION OF ELECTRONS FROM SILICON AND GOLD INTO SILICON DIOXIDE [J].

GOODMAN, AM .

PHYSICAL REVIEW, 1966, 144 (02) :588-&

[7] PHOTOEMISSION OF HOLES FROM SILICON INTO SILICON DIOXIDE [J].

GOODMAN, AM .

PHYSICAL REVIEW, 1966, 152 (02) :780-&

[8]

Gotsberger A., 1969, APPLIED SOLID STATE, V1, P153

[9] CHARGE-CARRIER TRANSPORT PHENOMENA IN AMORPHOUS SIO2 - DIRECT MEASUREMENT OF DRIFT MOBILITY AND LIFETIME [J].

HUGHES, RC .

PHYSICAL REVIEW LETTERS, 1973, 30 (26) :1333-1336

[10] GEMINATE RECOMBINATION OF X-RAY EXCITED ELECTRON-HOLE PAIRS IN ANTHRACENE [J].

HUGHES, RC .

JOURNAL OF CHEMICAL PHYSICS, 1971, 55 (12) :5442-+

← 1 2 3 →