PHOTOINJECTION INTO SIO2 - ELECTRON SCATTERING IN IMAGE FORCE POTENTIAL WELL

[1] ELECTRON CORRELATION AND SCREENING EFFECTS - IN RELATION TO SURFACE PHYSICS [J]. SURFACE SCIENCE, 1964, 2 : 381 - 388

[2] BERGLUND CN, 1964, PHYS REV A-GEN PHYS, V136, P1030

[3] BARRIER ENERGIES IN METAL-SILICON DIOXIDE-SILICON STRUCTURES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1966, 27 (11-1) : 1873 - &

[4] The analysis of photoelectric sensitivity curves for clean metals at various temperatures [J]. PHYSICAL REVIEW, 1931, 38 (01): : 45 - 56

[5] PHOTOEMISSION OF ELECTRONS FROM METALS INTO SILICON DIOXIDE [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) : 3580 - &

[6] PHOTOEMISSION OF ELECTRONS FROM N-TYPE DEGENERATE SILICON INTO SILICON DIOXIDE [J]. PHYSICAL REVIEW, 1966, 152 (02): : 785 - +

[7] ELECTRON HALL EFFECT IN SILICON DIOXIDE [J]. PHYSICAL REVIEW, 1967, 164 (03): : 1145 - &

[8] PHOTOEMISSION OF ELECTRONS FROM SILICON AND GOLD INTO SILICON DIOXIDE [J]. PHYSICAL REVIEW, 1966, 144 (02): : 588 - &

[9] PHOTOEMISSION OF HOLES FROM SILICON INTO SILICON DIOXIDE [J]. PHYSICAL REVIEW, 1966, 152 (02): : 780 - &

[10] SIMPLE MODEL FOR COLLISION EFFECTS IN PHOTOEMISSION [J]. PHYSICAL REVIEW, 1966, 147 (01): : 335 - &

[1] ELECTRON CORRELATION AND SCREENING EFFECTS - IN RELATION TO SURFACE PHYSICS [J]. SURFACE SCIENCE, 1964, 2 : 381 - 388

[2] BERGLUND CN, 1964, PHYS REV A-GEN PHYS, V136, P1030

[3] BARRIER ENERGIES IN METAL-SILICON DIOXIDE-SILICON STRUCTURES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1966, 27 (11-1) : 1873 - &

[4] The analysis of photoelectric sensitivity curves for clean metals at various temperatures [J]. PHYSICAL REVIEW, 1931, 38 (01): : 45 - 56

[5] PHOTOEMISSION OF ELECTRONS FROM METALS INTO SILICON DIOXIDE [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) : 3580 - &

[6] PHOTOEMISSION OF ELECTRONS FROM N-TYPE DEGENERATE SILICON INTO SILICON DIOXIDE [J]. PHYSICAL REVIEW, 1966, 152 (02): : 785 - +

[7] ELECTRON HALL EFFECT IN SILICON DIOXIDE [J]. PHYSICAL REVIEW, 1967, 164 (03): : 1145 - &

[8] PHOTOEMISSION OF ELECTRONS FROM SILICON AND GOLD INTO SILICON DIOXIDE [J]. PHYSICAL REVIEW, 1966, 144 (02): : 588 - &

[9] PHOTOEMISSION OF HOLES FROM SILICON INTO SILICON DIOXIDE [J]. PHYSICAL REVIEW, 1966, 152 (02): : 780 - &

[10] SIMPLE MODEL FOR COLLISION EFFECTS IN PHOTOEMISSION [J]. PHYSICAL REVIEW, 1966, 147 (01): : 335 - &