ELECTRONIC LEVEL OF HYDROGEN AND THERMAL-STABILITY OF HYDROGEN RELATED COMPLEXES IN GAAS

被引:8
作者
CLERJAUD, B [1 ]
GENDRON, F [1 ]
KRAUSE, M [1 ]
NAUD, C [1 ]
ULRICI, W [1 ]
机构
[1] ZENT INST ELEKT PHYS, O-1086 BERLIN, GERMANY
关键词
D O I
10.1016/0921-4526(91)90155-8
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Migrating hydrogen in GaAs has an electronic level located 0.5 eV above the top of the valence band. The carbon-hydrogen complexes observed in unintentionally doped LEC grown materials are stable up to at least 450-degrees-C. Hydrogen-lattice defect complexes are stable up to 600-650-degrees-C in as-grown LEC samples.
引用
收藏
页码:417 / 420
页数:4
相关论文
共 20 条
[1]   HYDROGEN IN CRYSTALLINE SILICON - A DEEP DONOR [J].
CAPIZZI, M ;
MITTIGA, A .
APPLIED PHYSICS LETTERS, 1987, 50 (14) :918-920
[2]  
CHEVALLIER J, 1988, ANNU REV MATER SCI, V18, P219
[3]   NEUTRALIZATION OF DEFECTS AND DOPANTS IN III-V SEMICONDUCTORS [J].
CHEVALLIER, J ;
CLERJAUD, B ;
PAJOT, B .
SEMICONDUCTORS AND SEMIMETALS, 1991, 34 (0C) :447-510
[4]   TRANSITION-METAL IMPURITIES IN III-V COMPOUNDS [J].
CLERJAUD, B .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (19) :3615-3661
[5]   UNINTENTIONAL HYDROGEN INCORPORATION IN CRYSTALS [J].
CLERJAUD, B .
PHYSICA B-CONDENSED MATTER, 1991, 170 (1-4) :383-391
[6]   ELECTRONIC LEVEL OF INTERSTITIAL HYDROGEN IN GAAS [J].
CLERJAUD, B ;
GENDRON, F ;
KRAUSE, M ;
ULRICI, W .
PHYSICAL REVIEW LETTERS, 1990, 65 (14) :1800-1803
[7]   EVIDENCE FOR COMPLEXES OF HYDROGEN WITH DEEP-LEVEL DEFECTS IN BULK III-V MATERIALS [J].
CLERJAUD, B ;
COTE, D ;
NAUD, C .
PHYSICAL REVIEW LETTERS, 1987, 58 (17) :1755-1757
[8]  
CLERJAUD B, 1988, MATER RES SOC S P, V104, P341
[9]  
CLERJAUD B, 1986, CURRENT ISSUES SEMIC, P117
[10]  
CLERJAUD B, 1989, LANDOLTBORNSTEIN B, V2