EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF HYDROGENATED AMORPHOUS SILICON-GERMANIUM ALLOYS .1. ANALYSIS BASED ON SPHERICAL WAVES OF PHOTOELECTRONS

被引：7

作者：

KAJIYAMA, H ^{[1
]}

FUKUHARA, A ^{[1
]}

NISHINO, Y ^{[1
]}

MURAMATSU, S ^{[1
]}

机构：

[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.38.1938

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1938 / 1941

页数：4

共 19 条

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