LIFE TIME MEASUREMENTS IN PBTE AND PBSNTE

被引：37

作者：

SCHLICHT, B

DORNHAUS, R

NIMTZ, G

HAAS, LD

JAKOBUS, T

机构：

来源：

SOLID-STATE ELECTRONICS | 1978年 / 21卷 / 11-1期

关键词：

D O I：

10.1016/0038-1101(78)90229-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1481 / 1485

页数：5

共 16 条

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[8] ELECTRONIC-STRUCTURE OF PBTE NEAR BAND-GAP [J].

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[9]

GERHARDTS RR, 1978, AUGER EFFECT HG1XCDX, V21, P1467

[10] NUCLEAR-MAGNETIC-RESONANCE STUDIES IN PBTE AND PB1-XSNXTE - EXPERIMENTAL DETERMINATION OF -]K . -]P BAND PARAMETERS AND MAGNETIC HYPERFINE CONSTANTS [J].

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