ATOMIC-SCALE STUDIES OF SEGREGATION AT CERAMIC/METAL HETEROPHASE INTERFACES

被引：35

作者：

SHASHKOV, DA ^{[1
]}

SEIDMAN, DN ^{[1
]}

机构：

[1] NORTHWESTERN UNIV,MAT RES CTR,EVANSTON,IL 60208

来源：

PHYSICAL REVIEW LETTERS | 1995年 / 75卷 / 02期

关键词：

D O I：

10.1103/PhysRevLett.75.268

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Atom-probe field-ion microscopy was used to measure quantitatively γAg, the absolute values of the Gibbsian interfacial excess of Ag, at semicoherent MgO/Cu(Ag) {222} heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg,Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter, in a single-phase Cu(Ag) matrix. The measured value of γAg at 500°C is (2±0.6)×1015 atoms cm-2. © 1995 The American Physical Society.

引用

页码：268 / 271

页数：4

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