RAMAN-SCATTERING FROM MICROCRYSTALLINE SI FILMS - CONSIDERATIONS OF COMPOSITE STRUCTURES WITH DIFFERENT OPTICAL-ABSORPTION PROPERTIES

被引:15
作者
NEMANICH, RJ
BUEHLER, EC
LEGRICE, YM
SHRODER, RE
PARSONS, GN
WANG, C
LUCOVSKY, G
BOYCE, JB
机构
[1] N CAROLINA STATE UNIV,DEPT MAT SCI & ENGN,RALEIGH,NC 27695
[2] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
关键词
D O I
10.1016/0022-3093(89)90729-1
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:813 / 815
页数:3
相关论文
共 4 条
[1]   RAMAN-SPECTROSCOPY OF LOW-DIMENSIONAL SEMICONDUCTORS [J].
FAUCHET, PM ;
CAMPBELL, IH .
CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1988, 14 :S79-S101
[2]   RAMAN-SCATTERING FROM HYDROGENATED MICROCRYSTALLINE AND AMORPHOUS-SILICON [J].
IQBAL, Z ;
VEPREK, S .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1982, 15 (02) :377-392
[3]   LIGHT-SCATTERING STUDY OF BORON-NITRIDE MICRO-CRYSTALS [J].
NEMANICH, RJ ;
SOLIN, SA ;
MARTIN, RM .
PHYSICAL REVIEW B, 1981, 23 (12) :6348-6356
[4]  
SHRODER RE, IN PRESS