PRACTICAL ELECTRON SPECTROMETER FOR CHEMICAL-ANALYSIS

[1] COSTA JL, 1977, 35TH ANN P EL MICR S, P238

[2] HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (04) : 411 - &

[3] 2-DIRECTIONAL FOCUSING OF CHARGED PARTICLES WITH A SECTOR-SHAPED, UNIFORM MAGNETIC FIELD [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (10) : 717 - 722

[4] EGERTON RF, 1975, ADV ELECTRON MICROSC, P35

[5] HENNEQUIN JF, 1960, THESIS U PARIS

[6] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52

[7] CHOICE OF OPERATING PARAMETERS FOR MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROSCOPY [J]. ULTRAMICROSCOPY, 1978, 3 (01) : 69 - 74

[8] JOY DC, 1977, P EMAG77 GLASGOW, P357

[9] MAHER DM, 1978, 9TH P INT C EL MICR, V1, P530

[10] SILCOX J, 1977, 10TH P ANN SEM S CHI, V1, P393

[1] COSTA JL, 1977, 35TH ANN P EL MICR S, P238

[2] HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (04) : 411 - &

[3] 2-DIRECTIONAL FOCUSING OF CHARGED PARTICLES WITH A SECTOR-SHAPED, UNIFORM MAGNETIC FIELD [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (10) : 717 - 722

[4] EGERTON RF, 1975, ADV ELECTRON MICROSC, P35

[5] HENNEQUIN JF, 1960, THESIS U PARIS

[6] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52

[7] CHOICE OF OPERATING PARAMETERS FOR MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROSCOPY [J]. ULTRAMICROSCOPY, 1978, 3 (01) : 69 - 74

[8] JOY DC, 1977, P EMAG77 GLASGOW, P357

[9] MAHER DM, 1978, 9TH P INT C EL MICR, V1, P530

[10] SILCOX J, 1977, 10TH P ANN SEM S CHI, V1, P393