A STUDY OF THE PROPAGATION MODE FOR METALLIC VAPORS IN SHADOW-CASTING BY VACUUM EVAPORATION OF AU-198 AND CR-51

被引:19
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PREUSS, LE
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10.1063/1.1721186
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O59 [应用物理学];
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页码:1401 / 1409
页数:9
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共 13 条
[1]  
AFFLECK JH, 1952, NOV ST LOUIS M AM PH
[2]   A TRACER METHOD FOR THE THICKNESS MEASUREMENT OF THIN BI FILMS [J].
ANTAL, JJ ;
WEBER, AH .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1952, 23 (08) :424-426
[3]  
BARNES WH, 1951, CAN J PHYS, V29
[4]  
DEVIENNE M, 1951, COMPT REND, P232
[5]  
ELLS CE, 1952, J APPL PHYS, V23, P31, DOI 10.1063/1.1701973
[6]   ON THE METALLIC SHADOW-CASTING USING A NOZZLE SYSTEM [J].
HIBI, T .
JOURNAL OF APPLIED PHYSICS, 1952, 23 (09) :957-963
[7]   THE USE OF RADIOACTIVE ISOTOPES IN A STUDY OF EVAPORATION FROM THERMIONIC CATHODES [J].
LEVERTON, WF ;
SHEPHERD, WG .
JOURNAL OF APPLIED PHYSICS, 1952, 23 (07) :787-793
[8]  
PREUSS LE, UNPUB
[9]   THE THICKNESS MEASUREMENT OF THIN FILMS BY MULTIPLE BEAM INTERFEROMETRY [J].
SCOTT, GD ;
MCLAUCHLAN, TA ;
SENNETT, RS .
JOURNAL OF APPLIED PHYSICS, 1950, 21 (09) :843-846
[10]   The thickness of electron microscopic objects [J].
Williams, RC ;
Wyckoff, RWG .
JOURNAL OF APPLIED PHYSICS, 1944, 15 (10) :712-716