POSITRON LIFETIME SPECTROSCOPY OF N-TYPE AND P-TYPE POROUS SILICON

被引：6

作者：

DANNEFAER, S ^{[1
]}

BRETAGNON, T ^{[1
]}

FOUCARAN, A ^{[1
]}

TALIERCIO, T ^{[1
]}

KERR, D ^{[1
]}

机构：

[1] UNIV MONTPELLIER 2,GES,CNRS,F-34095 MONTPELLIER 05,FRANCE

来源：

THIN SOLID FILMS | 1995年 / 255卷 / 1-2期

关键词：

POSITRON SPECTROSCOPY; SEMICONDUCTORS; SILICON;

D O I：

10.1016/0040-6090(94)05647-V

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Positron lifetime spectroscopy was used to investigate similar to 150 mu m thick porous layers. Very significant positronium formation in the porous layer was found, amounting to similar to 20% of all positrons. The positronium lifetime is exceptionally high (40-55 ns) which indicates that the positronium interacts weakly with the pore surfaces. Aging of porous silicon can remove completely the positronium response.

引用

页码：171 / 173

页数：3

共 10 条

[1]

Bretagnon T., 1992, Materials Science Forum, V105-110, P1841, DOI 10.4028/www.scientific.net/MSF.105-110.1841

[2] SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].

CANHAM, LT .

APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048

[3] VACANCY-TYPE DEFECTS IN CRYSTALLINE AND AMORPHOUS SIO2 [J].

DANNEFAER, S ;

BRETAGNON, T ;

KERR, D .

JOURNAL OF APPLIED PHYSICS, 1993, 74 (02) :884-890

[4]

DANNEFAER S, 1990, DEFECT CONTROL SEMIC, P1561

[5] A QUANTITATIVE STUDY OF IMPURITIES IN PHOTOLUMINESCENT AND NONPHOTOLUMINESCENT POROUS SILICON LAYERS [J].

GROSMAN, A ;

ORTEGA, C ;

SIEJKA, J ;

CHAMARRO, M .

JOURNAL OF APPLIED PHYSICS, 1993, 74 (03) :1992-1996

[6]

HAUTOJARVI P, 1979, TOPICS CURRENT PHYSI, V12

[7] POROSITY AND PORE-SIZE DISTRIBUTIONS OF POROUS SILICON LAYERS [J].

HERINO, R ;

BOMCHIL, G ;

BARLA, K ;

BERTRAND, C ;

GINOUX, JL .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (8A) :1994-2000

[8]

ITOH Y, 1993, APPL PHYS LETT, V63, P2768

[9]

KIRKEGAARD P, 1980, M2740 RIS NAT LAB RI

[10] ELECTROPOLISHING SILICON IN HYDROFLUORIC ACID SOLUTIONS [J].

TURNER, DR .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1958, 105 (07) :402-408

← 1 →