MEAN-FREE-PATH CONCEPT IN POLYCRYSTALLINE METALS

被引：41

作者：

VANCEA, J

REISS, G

HOFFMANN, H

机构：

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.35.6435

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6435 / 6437

页数：3

共 14 条

[1] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[2]

Ioffe AF., 1960, PROGRESSES SEMICONDU, V4, P237

[3]

IOFFE AF, 1956, CAN J PHYS, V34, P1393

[4] SPATIAL VARIATION OF CURRENTS AND FIELDS DUE TO LOCALIZED SCATTERERS IN METALLIC CONDUCTION [J].

LANDAUER, R .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1957, 1 (03) :223-231

[5] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].

MAYADAS, AF ;

SHATZKES, M .

PHYSICAL REVIEW B, 1970, 1 (04) :1382-&

[6]

MEADEN GT, 1965, ELECTRICAL RESISTANC, P15

[7] ELECTRICAL-CONDUCTION IN CONCENTRATED DISORDERED TRANSITION-METAL ALLOYS [J].

MOOIJ, JH .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 17 (02) :521-530

[8] GRAIN-BOUNDARY RESISTANCE IN POLYCRYSTALLINE METALS [J].

REISS, G ;

VANCEA, J ;

HOFFMANN, H .

PHYSICAL REVIEW LETTERS, 1986, 56 (19) :2100-2103

[9] PERCOLATION-THRESHOLD AND MEAN GRAIN-SIZE IN ALXSI1-X THIN-FILMS [J].

REISS, G ;

VANCEA, J ;

HOFFMANN, H .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (21) :L657-L660

[10] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

ADVANCES IN PHYSICS, 1952, 1 (01) :1-42

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