STRAGGLING AND PARTICLE IDENTIFICATION IN SILICON DETECTORS

被引:18
作者
BICHSEL, H
机构
来源
NUCLEAR INSTRUMENTS & METHODS | 1970年 / 78卷 / 02期
关键词
D O I
10.1016/0029-554X(70)90064-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:277 / &
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