PERPENDICULAR RESISTANCE OF CO/CU MULTILAYERS PREPARED BY MOLECULAR-BEAM EPITAXY

被引:18
作者
LIST, NJ
PRATT, WP
HOWSON, MA
XU, J
WALKER, MJ
GREIG, D
机构
[1] MICHIGAN STATE UNIV,DEPT PHYS & ASTRON,E LANSING,MI 48824
[2] MICHIGAN STATE UNIV,CTR FUNDAMENTAL MAT RES,E LANSING,MI 48824
基金
英国工程与自然科学研究理事会; 美国国家科学基金会;
关键词
D O I
10.1016/0304-8853(95)00264-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The magnetoresistance (MR) of layered metal systems with the current in a direction perpendicular to the plane of the layers (CPP) is studied. The technique for measuring the resulting very small resistances utilises a SQUID to act as a high-precision current comparator. The samples are Co/Cu multilayers grown by molecular beam epitaxy (MBE) in ultrahigh vacuum (UHV). Perpendicular resistance measurements are reported for Nb/Cu/X/Cu/Nb where X is the Co/Cu multilayer. The Co is fixed at a nominal value of 1.5 nm while the Cu is varied between 1 and 5 nm. These measurements show large oscillations in the CPP-MR as the Cu thickness is increased. A comparison is made between MBE and sputtered samples.
引用
收藏
页码:342 / 343
页数:2
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