MASS-TRANSPORT ALONG GRAIN-BOUNDARIES OF SILVER

被引：10

作者：

TU, KN

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 03期

关键词：

D O I：

10.1063/1.1661266

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1303 / &

共 10 条

[1] ELECTROMIGRATION DAMAGE IN ALUMINUM FILM CONDUCTORS [J].

ATTARDO, MJ ;

ROSENBERG, R .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (06) :2381-+

[2] SEEMAN-BOHLIN X-RAY DIFFRACTOMETER FOR THIN FILMS [J].

FEDER, R ;

BERRY, BS .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 (OCT1) :372-&

[3] RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS [J].

ROSENBERG, R ;

BERENBAUM, L .

APPLIED PHYSICS LETTERS, 1968, 12 (05) :201-+

[4]

SCHOBER T, 1969, J APPL PHYS, V40, P4659

[5]

Shewmon P, 2016, DIFFUSION SOLIDS, DOI [10.1007/978-3-319-48206-4, DOI 10.1007/978-3-319-48206-4]

[6]

TU KM, UNPUBLISHED

[7]

TURNBULL D, 1970, PHASE TRANSFORMATION

[8] MEASUREMENT OF RAPID MASS TRANSPORT ALONG INDIVIDUAL DISLOCATIONS IN ALUMINUM [J].

VOLIN, TE ;

LIE, KH ;

BALLUFFI, RW .

ACTA METALLURGICA, 1971, 19 (04) :263-&

[9] DIRECT OBSERVATION OF RAPID SELF-DIFFUSION ALONG DISLOCATIONS IN ALUMINUM [J].

VOLIN, TE ;

BALLUFFI, RW .

APPLIED PHYSICS LETTERS, 1967, 11 (08) :259-&

[10] DIFFUSION IN EVAPORATED FILMS OF GOLD-LEAD [J].

WEAVER, C ;

BROWN, LC .

PHILOSOPHICAL MAGAZINE, 1963, 8 (92) :1379-&

← 1 →