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SURFACE ORIENTATION EFFECT OF SHADOW OF STACKING FAULT
被引:15
作者
:
SUNAMI, H
论文数:
0
引用数:
0
h-index:
0
机构:
Research Institute of Electrical Communication, Tohoku University, Sendai
SUNAMI, H
TERASAKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
Research Institute of Electrical Communication, Tohoku University, Sendai
TERASAKI, T
MIYAMOTO, N
论文数:
0
引用数:
0
h-index:
0
机构:
Research Institute of Electrical Communication, Tohoku University, Sendai
MIYAMOTO, N
NISHIZAW.JI
论文数:
0
引用数:
0
h-index:
0
机构:
Research Institute of Electrical Communication, Tohoku University, Sendai
NISHIZAW.JI
机构
:
[1]
Research Institute of Electrical Communication, Tohoku University, Sendai
来源
:
JOURNAL OF APPLIED PHYSICS
|
1969年
/ 40卷
/ 11期
关键词
:
D O I
:
10.1063/1.1657258
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
[No abstract available]
引用
收藏
页码:4670 / &
相关论文
共 2 条
[1]
GEOMETRICAL STABILITY OF SHALLOW SURFACE DEPRESSIONS DURING GROWTH OF (111) AND (100) EPITAXIAL SILICON
[J].
DRUM, CM
论文数:
0
引用数:
0
h-index:
0
DRUM, CM
;
CLARK, CA
论文数:
0
引用数:
0
h-index:
0
CLARK, CA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(06)
:664
-&
[2]
TOLANSKY S, 1948, MULTIPLEBEAM INTERFE
←
1
→
共 2 条
[1]
GEOMETRICAL STABILITY OF SHALLOW SURFACE DEPRESSIONS DURING GROWTH OF (111) AND (100) EPITAXIAL SILICON
[J].
DRUM, CM
论文数:
0
引用数:
0
h-index:
0
DRUM, CM
;
CLARK, CA
论文数:
0
引用数:
0
h-index:
0
CLARK, CA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(06)
:664
-&
[2]
TOLANSKY S, 1948, MULTIPLEBEAM INTERFE
←
1
→