AN AUTOFOCUS METHOD FOR A TEM

被引:64
作者
KOSTER, AJ
VANDENBOS, A
VANDERMAST, KD
机构
[1] Department of Applied Physics, Delft University of Technology, 2628 CJ Delft, Netherlands
关键词
D O I
10.1016/0304-3991(87)90146-X
中图分类号
TH742 [显微镜];
学科分类号
摘要
MICROSCOPIC EXAMINATION
引用
收藏
页码:209 / 221
页数:13
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