共 20 条
[1]
Bardeen J., 1952, IMPERFECTIONS NEARLY, P261
[2]
Barrett CS, 1935, T AM I MIN MET ENG, V117, P39
[3]
DIFFRACTION CONTRAST ANALYSIS OF 2-DIMENSIONAL DEFECTS PRESENT IN SILICON AFTER ANNEALING
[J].
PHILOSOPHICAL MAGAZINE,
1966, 13 (121)
:71-&
[4]
ELECTRON MICROSCOPIC IMAGES OF SINGLE AND INTERSECTING STACKING FAULTS IN THICK FOILS .1. SINGLE FAULTS
[J].
PHYSICA STATUS SOLIDI,
1963, 3 (09)
:1563-1593
[5]
Hansen M., 1958, J ELECTROCHEM SOC, DOI DOI 10.1149/1.2428700
[6]
HIRSCH PB, 1965, ELECTRON MICROSCOPY
[7]
LATTICE PARAMETER AND STRUCTURE OF SILVER-COPPER ALLOYS RAPIDLY QUENCHED FROM LIQUID STATE
[J].
ACTA METALLURGICA,
1966, 14 (01)
:73-&
[8]
PREPARATION OF THIN FOILS FOR ELECTRON MICROSCOPY USING A CONTROLLED LOW TEMPERATURE TECHNIQUE
[J].
JOURNAL OF SCIENTIFIC INSTRUMENTS,
1966, 43 (06)
:367-&
[9]
RATY R, 1968, THESIS FINLAND I TEC
[10]
SHOCKLEY W, 1952, IMPERFECTIONS NEA ED, P261