OPTIMIZATION OF SMALL ELECTRON PROBES

被引：26

作者：

CREWE, AV ^{[1
]}

机构：

[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

来源：

关键词：

DIFFRACTION - ELECTRON PROBES - LENS ABERRATIONS;

D O I：

10.1016/0304-3991(87)90161-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：159 / 167

页数：9

共 8 条

BLACK, G ;

LINFOOT, EH .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1957, 239 (1219) :522-540

[2]

CREWE AV, 1982, OPTIK, V60, P271

[3] ON THE OPTIMUM RESOLUTION FOR A CORRECTED STEM [J].

CREWE, AV ;

SALZMAN, DB .

[4]

CREWE AV, 1986, 11TH P INT C EL MICR, V3, P2105

[5]

HOPKINS WH, 1955, P ROY SOC LONDON A, V231, P98

[6] CHROMATIC ABERRATION EFFECTS IN SMALL ELECTRON PROBES [J].

SHAO, ZF ;

CREWE, AV .

[7]

SPEIDEL R, 1986, OPTIK, V73, P138

[8]

TUGGLE D, 1979, J VACUUM SCI TECHNOL, V16, P1599