DIFFUSION OF CADMIUM IN LEAD-TELLURIDE

被引：4

作者：

BOBRUIKO, VB

KOUZNETZOVA, TA

BELYANSKY, MP

GASKOV, AM

机构：

[1] Chemistry Department, Moscow State University, Moscow

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1995年 / 32卷 / 1-2期

关键词：

AUGER ELECTRON SPECTROSCOPY; CADMIUM; DIFFUSION; LEAD TELLURIDE;

D O I：

10.1016/0921-5107(94)01159-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In order to determine the diffusion coefficient of cadmium in lead telluride D-Cd, CdTe/PbTe heterostructures were prepared by hot wall epitaxy. To obtain the cadmium concentration profile, quantitative Auger electron spectroscopy (AES) and sputtered-neutral mass spectroscopy (SNMS) were used. The data on the cadmium depth profile were used for evaluation of the dependence of D-Cd on temperature at low temperatures (350-450 degrees C) in heterostructures. The data obtained for D-Cd vs. temperature are close to those calculated using the equation known for higher temperatures.

引用

页码：7 / 10

页数：4