POLARITY DETERMINATION OF CDTE CRYSTALS BY ELECTRON-DIFFRACTION

被引：17

作者：

HEWAT, EA

DICIOCCIO, L

MILLION, A

DUPUY, M

GAILLIARD, JP

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 10期

关键词：

D O I：

10.1063/1.340435

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4929 / 4932

页数：4

共 19 条

[1] POLARITY DETERMINATION IN COMPOUND SEMICONDUCTORS BY CHANNELING - APPLICATION TO HETEROEPITAXY [J].

CHAMI, AC ;

LIGEON, E ;

DANIELOU, R ;

FONTENILLE, J .

APPLIED PHYSICS LETTERS, 1988, 52 (18) :1502-1504

[2]

Cowley J.M., 1975, DIFFRACTION PHYS, V1

[3]

DICIOCCIO L, 1987, I PHYS C SER, V87, P243

[4]

DUPUY M, 1984, J MICROSC SPECT ELEC, V9, P163

[5] CDXHG1-XTE N-TYPE LAYERS GROWN BY MOLECULAR-BEAM EPITAXY [J].

FAURIE, JP ;

MILLION, A .

APPLIED PHYSICS LETTERS, 1982, 41 (03) :264-266

[6] CRYSTALLOGRAPHIC POLARITY AND ETCHING OF CADMIUM TELLURIDE [J].

FEWSTER, PF ;

WHIFFIN, PAC .

JOURNAL OF APPLIED PHYSICS, 1983, 54 (08) :4668-4670

[7] NUMERICAL EVALUATION OF N-BEAM WAVE-FUNCTIONS IN ELECTRON-SCATTERING BY MULTI-SLICE METHOD [J].

GOODMAN, P ;

MOODIE, AF .

ACTA CRYSTALLOGRAPHICA SECTION A, 1974, A 30 (MAR) :280-290

[8]

HEWAT AW, 1970, THESIS U MELBOURNE

[9] ETCH PITS AND POLARITY IN CDTE CRYSTALS [J].

INOUE, M ;

TAKAYANAGI, S ;

TERAMOTO, I .

JOURNAL OF APPLIED PHYSICS, 1962, 33 (08) :2578-&

[10] CD AND TE DISLOCATIONS IN CDTE [J].

INOUE, M ;

TAKAYANAGI, S ;

TERAMOTO, I .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (02) :404-&

← 1 2 →