ENERGY-SPECTRA OF DISLOCATIONS IN SILICON AND GERMANIUM

被引:36
作者
SCHROTER, W [1 ]
SCHEIBE, E [1 ]
SCHOEN, H [1 ]
机构
[1] UNIV GOTTINGEN,BEREICH SONDERFORSCH,D-3400 GOTTINGEN,FED REP GER
来源
JOURNAL OF MICROSCOPY-OXFORD | 1980年 / 118卷 / JAN期
关键词
D O I
10.1111/j.1365-2818.1980.tb00242.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:23 / 34
页数:12
相关论文
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