ISICL - IN-SITU COHERENT LIDAR FOR PARTICLE-DETECTION IN SEMICONDUCTOR-PROCESSING EQUIPMENT

被引:8
作者
HOBBS, PCD
机构
[1] Manufacturing Research Department, IBM Thomas J. Watson Research Center, Yorktown Heights, NY
来源
APPLIED OPTICS | 1995年 / 34卷 / 09期
关键词
LIDAR; LASER RADAR; SEMICONDUCTOR-PROCESS CONTROL; PARTICLE COUNTING; IN SITU MEASUREMENT; LASER PARTICLE COUNTERS; PARTICULATE CONTAMINATION;
D O I
10.1364/AO.34.001579
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A scanning coherent lidar (laser radar) for detecting and mapping isolated submicrometer particles in hostile or inaccessible regions such as plasma chambers, ovens, tanks, and pipes is described. The sensor uses a noise-canceled diode laser homodyne interferometer of novel design that is insensitive to misalignment, runs at the quantum limit, and requires just one access window. At a false-count rate of 10(-5) Hz, the sensor needs 50 photons to detect a particle. A combination of techniques makes the system immune to stray light or laser light scattered from the chamber walls, though these other light sources may be 10(6) times more intense than the desired signal.
引用
收藏
页码:1579 / 1590
页数:12
相关论文
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