PIXE MICROPROBE FOR GEOSCIENCE APPLICATIONS

被引：27

作者：

MEIJER, J

STEPHAN, A

ADAMCZEWSKI, J

BUKOW, HH

ROLFS, C

PICKART, T

BRUHN, F

VEIZER, J

机构：

[1] RUHR UNIV BOCHUM,INST MINERAL,D-44780 BOCHUM,GERMANY

[2] RUHR UNIV BOCHUM,INST GEOL,D-44780 BOCHUM,GERMANY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1994年 / 89卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(94)95178-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Microprobe analysis with PIXE (proton induced X-ray emission) is a well known analytical method with detection limits at the ppm level. It is frequently used for geoscience applications. To improve the versatility and reliability, the Bochum microprobe facility has been reconstructed incorporating a new data acquisition system, a beam dose monitor, and a new slit system.

引用

页码：229 / 232

页数：4

共 5 条

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