QUANTITATIVE PIXE MICROANALYSIS OF THICK SPECIMENS

被引：75

作者：

CAMPBELL, JL

HIGUCHI, D

MAXWELL, JA

TEESDALE, WJ

机构：

[1] Guelph-Waterloo Program for Graduate Work in Physics, University of Guelph, Guelph

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 77卷 / 1-4期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/0168-583X(93)95530-I

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Methods of standardization in quantitative micro-PIXE analysis are reviewed and various issues that bear on analytical accuracy are explored; pertinent recent work on Si(Li) X-ray detector response is included and some geochemical examples are drawn upon. Extension of the GUPIX software to deal with multilayer targets, including secondary fluorescence within and between layers, is reported; analytical examples include alloy foils and multilayer solar cell structures.

引用

页码：95 / 109

页数：15

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[2]

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