AN EXACT TREATMENT OF SECONDARY AND TERTIARY FLUORESCENCE ENHANCEMENT IN PIXE

被引:24
作者
CAMPBELL, JL
WANG, JX
MAXWELL, JA
TEESDALE, WJ
机构
关键词
D O I
10.1016/0168-583X(89)90404-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:539 / 555
页数:17
相关论文
共 19 条
  • [1] Abramowitz M., 1970, HDB MATH FNCTIONS
  • [2] ENHANCEMENT IN PIXE ANALYSIS
    AHLBERG, MS
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 61 - 65
  • [3] Berger MJ, 1987, NBSIR873597
  • [4] PIXE ANALYSIS OF THICK TARGETS
    CAMPBELL, JL
    COOKSON, JA
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) : 185 - 197
  • [5] WIDTHS AND FLUORESCENCE YIELDS OF ATOMIC L-SHELL VACANCY STATES
    CHEN, MH
    CRASEMANN, B
    MARK, H
    [J]. PHYSICAL REVIEW A, 1981, 24 (01): : 177 - 182
  • [6] CHEN MH, 1985, ATOM DATA NUCL DATA, V33, P217
  • [7] JOHANSSON SAE, 1988, PIXE NOVEL TECHNIQUE, P104
  • [8] MAXWELL JA, IN PRESS NUCL INSTR
  • [9] ENHANCEMENT CORRECTION IN HIGH-ENERGY PARTICLE INDUCED X-RAY-EMISSION ANALYSIS
    MOMMSEN, H
    SARKAR, M
    SARTER, W
    SCHMITTINGER, T
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 166 (03): : 361 - 365
  • [10] QUANTITATIVE-ANALYSIS OF COMPLEX TARGETS BY PROTON-INDUCED X-RAYS
    REUTER, W
    LURIO, A
    CARDONE, F
    ZIEGLER, JF
    [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) : 3194 - 3202