AN EXACT TREATMENT OF SECONDARY AND TERTIARY FLUORESCENCE ENHANCEMENT IN PIXE

被引：24

作者：

CAMPBELL, JL

WANG, JX

MAXWELL, JA

TEESDALE, WJ

机构：

来源：

关键词：

D O I：

10.1016/0168-583X(89)90404-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：539 / 555

页数：17

共 19 条

[1] Abramowitz M., 1970, HDB MATH FNCTIONS
[2] ENHANCEMENT IN PIXE ANALYSIS
AHLBERG, MS
[J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 61 - 65
[3] Berger MJ, 1987, NBSIR873597
[4] PIXE ANALYSIS OF THICK TARGETS
CAMPBELL, JL
COOKSON, JA
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) : 185 - 197
[5] WIDTHS AND FLUORESCENCE YIELDS OF ATOMIC L-SHELL VACANCY STATES
CHEN, MH
CRASEMANN, B
MARK, H
[J]. PHYSICAL REVIEW A, 1981, 24 (01): : 177 - 182
[6] CHEN MH, 1985, ATOM DATA NUCL DATA, V33, P217
[7] JOHANSSON SAE, 1988, PIXE NOVEL TECHNIQUE, P104
[8] MAXWELL JA, IN PRESS NUCL INSTR
[9] ENHANCEMENT CORRECTION IN HIGH-ENERGY PARTICLE INDUCED X-RAY-EMISSION ANALYSIS
MOMMSEN, H
SARKAR, M
SARTER, W
SCHMITTINGER, T
[J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 166 (03): : 361 - 365
[10] QUANTITATIVE-ANALYSIS OF COMPLEX TARGETS BY PROTON-INDUCED X-RAYS
REUTER, W
LURIO, A
CARDONE, F
ZIEGLER, JF
[J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) : 3194 - 3202