Electric field broadening of gallium acceptor states in compensated Ge:Ga,As

被引:1
作者
Itoh, KM
Walukiewicz, W
Beeman, JW
Haller, EE
Kim, HJ
Mayur, AJ
Sciacca, MD
Ramdas, AK
Buczko, R
Farmer, JW
Ozhogin, VI
机构
[1] LAWRENCE BERKELEY LAB,BERKELEY,CA 94720
[2] UNIV CALIF BERKELEY,BERKELEY,CA 94720
[3] PURDUE UNIV,W LAFAYETTE,IN 47907
[4] POLISH ACAD SCI,INST PHYS,PL-02668 WARSAW,POLAND
[5] UNIV MISSOURI,COLUMBIA,MO 65211
[6] IV KURCHATOV ATOM ENERGY INST,MOSCOW 123182,RUSSIA
来源
ICDS-18 - PROCEEDINGS OF THE 18TH INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS, PTS 1-4 | 1995年 / 196-卷
关键词
impurities in semiconductors; compensation; infrared absorption;
D O I
10.4028/www.scientific.net/MSF.196-201.127
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on low-temperature infrared absorption spectroscopy studies of p-type Ge:Ga,As samples with varying doping compensation ratios. Previous difficulties in fabricating appropriate samples are overcome by applying the neutron transmutation doping technique to high purity germanium of isotopically controlled composition with Ge-70 and Ge-74. With this technique, we have produced a series of crystals with compensation ratios between 0.082 and 0.87 while maintaining the net-acceptor concentration [Ga]-[As] constant at 5x10(14)cm(-3). The observed Ga impurity absorption peaks broaden linearly with the ionized impurity concentration due to the quadrupole interactions between Ga bound holes and the electric field gradient. Experimental linewidths are quantitatively compared to existing theories of electric field broadening for donor 1s-2p transitions. We find excellent agreement with the theory which is based on the correlated distribution of ionized impurity centers.
引用
收藏
页码:127 / 131
页数:5
相关论文
共 9 条
[1]   NEUTRON TRANSMUTATION DOPING OF ISOTOPICALLY ENGINEERED GE [J].
ITOH, KM ;
HALLER, EE ;
HANSEN, WL ;
BEEMAN, JW ;
FARMER, JW ;
RUDNEV, A ;
TIKHOMIROV, A ;
OZHOGIN, VI .
APPLIED PHYSICS LETTERS, 1994, 64 (16) :2121-2123
[2]   LINEWIDTHS OF THE ELECTRONIC EXCITATION-SPECTRA OF DONORS IN SILICON [J].
JAGANNATH, C ;
GRABOWSKI, ZW ;
RAMDAS, AK .
PHYSICAL REVIEW B, 1981, 23 (05) :2082-2098
[3]   EXCITATION SPECTRA OF GROUP 3 IMPURITIES IN GERMANIUM [J].
JONES, RL ;
FISHER, P .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1965, 26 (07) :1125-&
[4]  
KALFA AA, 1973, SOV PHYS SEMICOND+, V6, P1839
[5]   PHOTOELECTRIC SPECTROSCOPY - NEW METHOD OF ANALYSIS OF IMPURITIES IN SEMICONDUCTORS [J].
KOGAN, SM ;
LIFSHITS, TM .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 39 (01) :11-39
[6]  
KOGAN SM, 1981, SOV PHYS SEMICOND+, V15, P26
[7]   INHOMOGENEOUS BROADENING OF LYMAN-SERIES ABSORPTION OF SIMPLE HYDROGENIC DONORS [J].
LARSEN, DM .
PHYSICAL REVIEW B, 1976, 13 (04) :1681-1691
[8]   INHOMOGENEOUS LINE BROADENING IN DONOR MAGNETO-OPTICAL SPECTRA [J].
LARSEN, DM .
PHYSICAL REVIEW B, 1973, 8 (02) :535-552
[9]   INTERNAL STARK-EFFECT ON IMPURITY STATES IN GERMANIUM [J].
OHYAMA, T .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1980, 98 (01) :373-378