RESOLUTION OF ELECTRON PROBE MICROANALYZERS

[1] ELECTRON PROBE X-RAY MICROANALYZER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (09) : 709 - 712

[2] BLANCHARD CH, 1951, PHYS REV, V82, P767

[3] BLOOM M, COMMUNICATION

[4] BOTHE W, 1927, HDB PHYS, V24, P18

[5] BUSCHMANN EC, 57GL201 GEN ENG LAB

[6] CASTAING, 1957, J METALS, V9, P389

[7] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[8] Castaing R., 1951, PUBLICATION ONERA, V55

[9] COMPTON AH, 1951, XRAYS THEORY EXPT, P76

[10] MICRO-ANALYSIS BY A FLYING-SPOT X-RAY METHOD [J]. NATURE, 1956, 177 (4521) : 1172 - 1173

[1] ELECTRON PROBE X-RAY MICROANALYZER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (09) : 709 - 712

[2] BLANCHARD CH, 1951, PHYS REV, V82, P767

[3] BLOOM M, COMMUNICATION

[4] BOTHE W, 1927, HDB PHYS, V24, P18

[5] BUSCHMANN EC, 57GL201 GEN ENG LAB

[6] CASTAING, 1957, J METALS, V9, P389

[7] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[8] Castaing R., 1951, PUBLICATION ONERA, V55

[9] COMPTON AH, 1951, XRAYS THEORY EXPT, P76

[10] MICRO-ANALYSIS BY A FLYING-SPOT X-RAY METHOD [J]. NATURE, 1956, 177 (4521) : 1172 - 1173