EXPERIMENTAL-OBSERVATIONS OF GATED FIELD EMITTER FAILURES

被引：15

作者：

BROWNING, J ^{[1
]}

MCGRUER, NE ^{[1
]}

BINTZ, WJ ^{[1
]}

GILMORE, M ^{[1
]}

机构：

[1] NORTHEASTERN UNIV,DEPT ELECT & COMP ENGN,BOSTON,MA 02146

来源：

IEEE ELECTRON DEVICE LETTERS | 1992年 / 13卷 / 03期

关键词：

D O I：

10.1109/55.144999

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Intrinsic failure events in gated field emitters have been studied. The gate-emitter voltage, typically 140 V during operation, drops to 10-70 V at the onset of the failure. Measurements with a diagnostic probe indicate plumes of ions and electrons are ejected into vacuum with the ion current typically 10% of the electron current. The arc voltage and the ion-to-electron current ratio are characteristic of a cathodic vacuum arc. For series resistors less than 1 k OMEGA, the arc is continuous, while for series resistors greater than 10 k OMEGA, the arc is intermittent.

引用

页码：167 / 169

页数：3

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