SUBMICRON-RESOLUTION STUDY OF A THIN NI-CRYSTAL USING A BRIGHTNESS-ENHANCED POSITRON REEMISSION MICROSCOPE

被引：57

作者：

BRANDES, GR ^{[1
]}

CANTER, KF ^{[1
]}

MILLS, AP ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

PHYSICAL REVIEW LETTERS | 1988年 / 61卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.61.492

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：492 / 495

页数：4

共 20 条

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APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1988, 46 (04) :335-337

[4]

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[5]

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[6]

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[9] PHOTOEMISSION FROM ACTIVATED GALLIUM-ARSENIDE .1. VERY-HIGH-RESOLUTION ENERGY-DISTRIBUTION CURVES [J].

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PHYSICAL REVIEW B, 1985, 31 (06) :3859-3871

[10] HIGH-RESOLUTION ANGLE-RESOLVED POSITRON REEMISSION SPECTRA FROM METAL-SURFACES [J].

FISCHER, DA ;

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