The low energy plasma induced dehydrogenative polymerization of various monosubstituted silanes (RSiH3) is shown to provide photosensitive films characterized as organosilicon hydride network materials with extensive Si-Si bonding. Plasma deposited films may be photo-oxidatively patterned with mid-deep ultraviolet light producing glasslike Si-O-Si crosslinked materials in exposed areas. Patterns can be developed by chlorine reactive ion etching with up to 5:1 selectivity, and transferred into underlying organic layers with > 50:1 selectivity and sub-half-micron resolution. This provides a versatile, completely dry photolithographic process useful with current exposure and etching tools and is well-suited for integration into cluster tool technologies.