EXPERIMENTAL-OBSERVATION OF THE SPLITTING AND SHIFTING OF HOLZ LINES INDUCED BY A LINE DEFECT IN THE QUASI-CRYSTALLINE ICOSAHEDRAL PHASE OF AL76SI4MN20

被引:8
作者
WANG, RH [1 ]
DAI, MX [1 ]
机构
[1] ACAD SINICA,BEIJING LAB ELECTRON MICROSCOPY,BEIJING 100080,PEOPLES R CHINA
关键词
D O I
10.1080/09500839008206490
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Diffraction contrast images of a line defect, and splitting and shifting of the higher-order Laue-zone lines induced by the strain field of the line defect, have been observed in the Al76Si4Mn20 quasicrystalline icosahedral phase. This phenomenon suggests that convergent-beam electron diffraction can be used to study such defects not only in crystals but also in quasicrystals. © 1990 Taylor & Francis Group, LLC.
引用
收藏
页码:119 / 123
页数:5
相关论文
共 10 条
[1]   3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J].
CARPENTER, RW ;
SPENCE, JCH .
ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN) :55-&
[2]  
DAI M, 1989, IN PRESS SOLID ST CO
[3]   THE DIFFRACTION PATTERN OF PROJECTED STRUCTURES [J].
ELSER, V .
ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 :36-43
[5]  
Hirabayashi M., 1987, Materials Science Forum, V22-24, P45, DOI 10.4028/www.scientific.net/MSF.22-24.45
[6]  
Kaneyama T., 1988, CONVERGENT BEAM ELEC
[7]  
TANAKA M, 1986, 11TH P INT C EL MICR, P203
[8]  
WANG R, 1986, 11TH P INT C EL MICR, P711
[9]   EFFECTS OF A STACKING-FAULT ON HIGHER-ORDER DIFFRACTION FRINGES [J].
WANG, RH ;
WEN, JG .
ACTA CRYSTALLOGRAPHICA SECTION A, 1989, 45 :428-431
[10]  
[No title captured]