EPITAXIAL-GROWTH OF C-60 THIN-FILMS ON MICA

被引：52

作者：

KRAKOW, W

RIVERA, NM

ROY, RA

RUOFF, RS

CUOMO, JJ

机构：

[1] IBM T. J. Watson Research Center, Yorktown Heights

来源：

JOURNAL OF MATERIALS RESEARCH | 1992年 / 7卷 / 04期

关键词：

D O I：

10.1557/JMR.1992.0784

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Single crystal films of C60 of different thickness values have been deposited on mica substrates by resistance evaporation. Electron diffraction and high resolution microscopy have been used to assess the orientational ordering and the nature of the defects present in these face-centered cubic films which exhibit a <111> direction normal to the film surface.

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页码：784 / 787

页数：4

相关论文

共 15 条

[1] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J].

CHERNS, D .

PHILOSOPHICAL MAGAZINE, 1974, 30 (03) :549-556

[2]

ELANDSSON R, 1988, J CHEM PHYS, V89, P5190

[3]

FLEMING RM, IN PRESS CHEM COMM

[4] ORIENTATIONAL ORDERING TRANSITION IN SOLID C60 [J].

HEINEY, PA ;

FISCHER, JE ;

MCGHIE, AR ;

ROMANOW, WJ ;

DENENSTEIN, AM ;

MCCAULEY, JP ;

SMITH, AB ;

COX, DE .

PHYSICAL REVIEW LETTERS, 1991, 66 (22) :2911-2914

[5]

KOMA A, 1991, NIKKAN KOGYO SH 0822, P6

[6] THE DIRECT OBSERVATION OF ATOMIC SURFACE-STRUCTURE AND INCLINED PLANAR DEFECTS IN AU(111) FILMS [J].

KRAKOW, W .

THIN SOLID FILMS, 1982, 93 (3-4) :235-253

[7]

KRAKOW W, UNPUB

[8] SOLID C-60 - A NEW FORM OF CARBON [J].

KRATSCHMER, W ;

LAMB, LD ;

FOSTIROPOULOS, K ;

HUFFMAN, DR .

NATURE, 1990, 347 (6291) :354-358

[9] THE INFRARED AND ULTRAVIOLET-ABSORPTION SPECTRA OF LABORATORY-PRODUCED CARBON DUST - EVIDENCE FOR THE PRESENCE OF THE C-60 MOLECULE [J].

KRATSCHMER, W ;

FOSTIROPOULOS, K ;

HUFFMAN, DR .

CHEMICAL PHYSICS LETTERS, 1990, 170 (2-3) :167-170

[10] C-60 - BUCKMINSTERFULLERENE [J].

KROTO, HW ;

HEATH, JR ;

OBRIEN, SC ;

CURL, RF ;

SMALLEY, RE .

NATURE, 1985, 318 (6042) :162-163