SURFACE PHOTOVOLTAGE IN UNDOPED SEMIINSULATING GAAS

被引:31
作者
LIU, Q
CHEN, C
RUDA, H
机构
[1] Department of Metallurgy and Material Science, University of Toronto, Toronto
关键词
D O I
10.1063/1.354973
中图分类号
O59 [应用物理学];
学科分类号
摘要
A theoretical model for the surface photovoltage effect (SPV) in undoped semi-insulating (SI) GaAs is presented. This model accounts for the large measured SPV signals for SI material compared with n-type material. The SPV effect in undoped SI GaAs is shown to originate predominantly from the large difference in mobilities between electrons and holes. The low dark conductivity of SI GaAs also plays an important role in determining the large measured signal. In this article experimental SPV data for undoped SI GaAs are presented and explained using the proposed model, providing a value for the ambipolar diffusion length of 1.4 mum. The native surface field contribution to the measured SPV signal is estimated experimentally and found to be negligible in undoped SI GaAs compared with the aforementioned effects.
引用
收藏
页码:7492 / 7496
页数:5
相关论文
共 20 条
[1]   DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J].
ASPNES, DE ;
STUDNA, AA .
PHYSICAL REVIEW B, 1983, 27 (02) :985-1009
[2]   SEMICONDUCTING AND OTHER MAJOR PROPERTIES OF GALLIUM-ARSENIDE [J].
BLAKEMORE, JS .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (10) :R123-R181
[3]   ON THE THEORETICAL BASIS OF THE SURFACE PHOTOVOLTAGE TECHNIQUE [J].
CHIANG, CL ;
WAGNER, S .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (09) :1722-1726
[4]   THEORY OF THE PHOTOVOLTAGE AT SEMICONDUCTOR SURFACES AND ITS APPLICATION TO DIFFUSION LENGTH MEASUREMENTS [J].
CHOO, SC ;
TAN, LS ;
QUEK, KB .
SOLID-STATE ELECTRONICS, 1992, 35 (03) :269-283
[5]  
DORANTESDAVILA J, 1980, APPL PHYS LETT, V38, P442
[6]  
FONASH SJ, 1981, SOLAR CELL PHYSICS
[8]   TRANSIENT PHOTOCONDUCTIVITY MEASUREMENTS IN SEMIINSULATING GAAS .1. AN ANALOG APPROACH [J].
KREMER, RE ;
ARIKAN, MC ;
ABELE, JC ;
BLAKEMORE, JS .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (06) :2424-2431
[9]   NONCONTACT MAPPING OF HEAVY-METAL CONTAMINATION FOR SILICON IC FABRICATION [J].
LAGOWSKI, J ;
EDELMAN, P ;
DEXTER, M ;
HENLEY, W .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (1A) :A185-A192
[10]   PICOSECOND RESPONSE OF STEADY-STATE PHOTOVOLTAIC EFFECT IN AN ASYMMETRICAL GRADED SEMICONDUCTOR SUPERLATTICE STRUCTURE [J].
LIU, JM ;
CHEN, LP ;
LIU, CT ;
BURRUS, CA ;
CHO, AY .
APPLIED PHYSICS LETTERS, 1993, 62 (11) :1179-1181