SCREENING OF HOT-CARRIER RELAXATION IN HIGHLY PHOTO-EXCITED SEMICONDUCTORS

被引：171

作者：

YOFFA, EJ

机构：

来源：

PHYSICAL REVIEW B | 1981年 / 23卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.23.1909

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1909 / 1919

页数：11

共 43 条

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