THE ROLE OF TRANSIENT ION-INDUCED DEFECTS IN ION-BEAM-ASSISTED GROWTH

被引:14
作者
KELLERMAN, BK [1 ]
CHASON, E [1 ]
FLORO, JA [1 ]
PICRAUX, ST [1 ]
WHITE, JM [1 ]
机构
[1] UNIV TEXAS,CTR SCI & TECHNOL,AUSTIN,TX 78712
关键词
D O I
10.1063/1.115022
中图分类号
O59 [应用物理学];
学科分类号
摘要
Low-energy ion bombardment, concurrent with growth, can control and improve many aspects of film growth, but confirming the atomistic mechanism responsible for these effects has been difficult. We present a simple picture of ion beam-assisted deposition as the interaction of growth-induced and ion-induced surface defects (adatoms and vacancies). We use kinetic Monte Carlo simulations to demonstrate that low-energy ion bombardment in conjunction with growth produces a smoother surface morphology than either growth or ion bombardment alone by destabilizing surface clusters and promoting step flow growth. (C) 1995 American Institute of Physics.
引用
收藏
页码:1703 / 1705
页数:3
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